Alcohol as source of specimen contamination in scanning electron microscopy
نویسندگان
چکیده
منابع مشابه
A scanning electron microscopy specimen holder for viewing different angles of a single specimen.
The specimen holder for scanning electron microscopy described herein allows a single specimen to be examined in any possible view and significantly improves object illumination. The specimen is glued to a fine pin and flexibly mounted on a double-sided adhesive conductive pad on a rotatable pivot. A milled pot placed beneath the specimen acts as an electron trap. This provides a homogeneous bl...
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Modern scanning transmission electron microscopy (STEM) enables imaging and microanalysis at very high magnification. In the case of aberration-corrected STEM, atomic resolution is readily achieved. However, the electron fluxes used may be up to three orders of magnitude greater than those typically employed in conventional STEM. Since specimen contamination often increases with electron flux, ...
متن کاملSpecimen collection for electron microscopy.
were “unknown agents.” For the sake of objectivity, we based our assumption on the aggregate of information for known pathogens rather than on “expert opinion.” Interestingly, however, the Council of Science and Technology’s “expert opinion” of the percentage of diarrheal illness due to foodborne transmission was 35% (1), nearly identical to the figure we developed. As noted in our article, pat...
متن کاملSpecimen collection for electron microscopy.
analysis of PCR products amplified from five strains of spotted fever group Rickettsiae with Rr with Rr 190. synthase gene comparison, a new tool for phylogenetic analysis, and its application for the Rickettsiae. To the Editor: As virologists whose specialties include diagnostic electron microscopy (EM), we read with interest the discussion on bioterrorism scenarios (1,2) and the subsequent no...
متن کاملSpecimen Preparation for Electron Microscopy
In general the SEM sample preparation techniques are more or less similar to the metallographic sample preparation technique for optical microscopy, because both the microscopes reveals the surface topography of sample. In SEM a focussed beam of electrons scans over the specimen surface and the electrons emitted from the sample surface controls the brightness of the CRT spot which also scans th...
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ژورنال
عنوان ژورنال: Scanning
سال: 1980
ISSN: 0161-0457
DOI: 10.1002/sca.4950030109